Techniques for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Methods
AS6171/9
This document defines capabilities and limitations of FTIR spectroscopy as it pertains to counterfeit electronic component detection and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of FTIR spectroscopy including: operator training, sample preparation, various sampling techniques, data interpretation, computerized spectral matching including pass/fail criteria, equipment maintenance, and reporting of data. The discussion is primarily aimed at analyses performed in the mid-infrared (IR) from 400 to 4000 wavenumbers; however, many of the concepts are applicable to the near and far IR.
If AS6171/9 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Rationale:
This document was created to provide guidance for those unfamiliar with Fourier Transform Infrared (FTIR) spectroscopy towards its application of counterfeit detection of electronic components. Additionally, this document is intended to provide guidelines for the application of FTIR spectroscopy and to define the compliance requirements for laboratories using this technique.
AS6171/9 has been reaffirmed to comply with the SAE Five-Year Review policy.
Related Topics:
Counterfeit parts
Data acquisition and handling
Materials identification
Carbon dioxide
Chemicals
Mathematical models
Identification numbers
Test procedures
Analysis methodologies
Also known as: SAE AS 6171/9
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