Guidance for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits
This document provides additional guidance on performing lifetime assessments and mitigations for ARP6338. It is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications.
Rationale: APMC has asked SSTC-G12 to provide additional detailed technical guidance as a companion document to their ARP6338. ARP6338 provides overarching goals with performing the analysis but does not address use of the JEDEC standards, determination of when the analysis is required, or how to evaluate assessment.