Technique for Suspect/Counterfeit EEE Parts Detection by Laser Scanning Microscopy (LSM) and Confocal Laser Scanning Microscopy (CLSM) Test Methods
This document defines capabilities and limitations of LSM and CLSM as they pertain to suspect/counterfeit EEE part detection. Additionally, this document outlines requirements associated with the application of LSM and CLSM including: operator training, sample preparation, various imaging techniques, data interpretation, calibration, and reporting of test results. This test method is primarily directed to analyses performed in the visible to near infrared range (approximately 400nm to 1100nm).
The Test Laboratory shall be accredited to ISO/IEC 17025 to perform the LSM and CLSM Test Methods as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 Scope statement, the specific method being accredited to:
Option 1: All AS6171/17 Test Methods, or
Option 2: All AS6171/17 Test Methods except CLSM.
If SAE AS6171/17 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Rationale: This document was created to provide requirements for those applying Laser Scanning Microscopy (LSM) and Confocal Laser Scanning Microscopy (CLSM) towards counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts. Additionally, this document provides guidelines for those unfamiliar with LSM and CLSM.