Browse Standards AS6171/2
Historical ISSUED 2016-10-30

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods AS6171/2

This document describes the requirements of the following test methods for counterfeit detection of electronic components:
  1. a
    Method A: General External Visual Inspection (EVI), Sample Selection, and Handling
  2. b
    Method B: Detailed EVI
  3. c
    Method C: Testing for Remarking and Resurfacing
  4. d
    Method D: Surface Texture Analysis by SEM
    NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.
AS6171/2A
2017-05-11
Latest
Revised
AS6171/2
2016-10-30
Historical
Issued

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