Browse Standards AS6171/20
WIP 2012-01-17

Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Photoelectron Spectroscopy (XPS) Test Method AS6171/20

To define capabilities and limitations of X-Ray Photoelectron Spectroscopy (XPS) as it pertains to detection of suspect/counterfeit EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of XPS including: operator training and requirements; sample preparation; data interpretation; and data reporting procedures.
Currently unavailable for purchase at this time

This Standard is currently a WIP.

X