Browse Standards AS6171/22
WIP 2012-01-17

Technique for Suspect/Counterfeit EEE Parts Detection by Scanning Electron Microscopy (SEM) including Energy Dispersive X-Ray Spectroscopy Test Methods AS6171/22

To define capabilities and limitations of SEM-EDS as it pertains to counterfeit detection of EEE parts and suggest possible applications to these ends. Additionally, this document outlines requirements associated with the application of SEM-EDS including: Operator training; Sample preparation; Data interpretation; Equipment maintenance; and Reporting of data. If SAE AS6171/22 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
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