Browse Standards AS6171/23
WIP 2012-01-17

Techniques for Suspect/Counterfeit EEE Assembly Detection by Various Test Methods AS6171/23

The intent of this test method is to describe high level processes to detect suspect/counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) Assemblies, covering both custom and military/commercial off-the-shelf (COTS) assemblies. This standard includes requirements for accreditation and certification of Laboratory and Laboratory personnel, and also, data collection, interpretation, and reporting as applicable to this test method. This standard covers EEE assemblies and includes electronic circuit card assemblies as defined under the definition for EEE Assembly and Electronic Circuit Card Assembly.
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