Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods
AS6171/2A
This document describes the requirements of the following test methods for counterfeit detection of electronic components:
a
Method A: General EVI, Sample Selection, and Handling
b
Method B: Detailed EVI, including Part Weight measurement
c
Method C: Testing for Remarking
d
Method D: Testing for Resurfacing
e
Method E: Part Dimensions measurement
f
Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Rationale:
Counterfeit electronic components frequently have external characteristics that may be used to identify them as suspect. Visual inspection by means of optical and scanning electron microscope (SEM) techniques requires well-defined processes in order to discern and document characteristics that are consistent with counterfeit parts.
The published version of AS6171/2 was found to be different from the version that was balloted and approved by the G-19A committee. This revision is needed to address that discrepancy.
Related Topics:
Counterfeit parts
Methanol
Identification numbers
Waste disposal
Test procedures
Imaging and visualization
Test equipment and instrumentation
Protective equipment
Hazardous materials
Also known as: SAE AS 6171/2
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