Browse Standards AS6171/2A
Current REVISED 2017-05-11

Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods AS6171/2A

This document describes the requirements of the following test methods for counterfeit detection of electronic components:
  1. a
    Method A: General EVI, Sample Selection, and Handling
  2. b
    Method B: Detailed EVI, including Part Weight measurement
  3. c
    Method C: Testing for Remarking
  4. d
    Method D: Testing for Resurfacing
  5. e
    Method E: Part Dimensions measurement
  6. f
    Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
AS6171/2A
2017-05-11
Latest
Revised
AS6171/2
2016-10-30
Historical
Issued

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