Browse Standards AS6171/2
WIP 2020-11-24

Techniques for Suspect/Counterfeit EEE Parts Detection by General and Detailed External Visual Inspection (EVI), Remarking and Resurfacing, and Part Dimension Measurement AS6171/2

This document contains a list of EVI tests that can be specified by the Requester to detect Suspect/Counterfeit EEE Parts. The following EVI tests described in this document are listed in 3.4 of AS6171 General Requirements: Method A: General EVI Method B: Detailed EVI, including Part Weight Measurement Method C: Testing for Remarking Method D: Testing for Resurfacing Method E: Part Dimensions Measurement When the SOW or the PO includes Part Packaging test(s) (refer to AS6171/15), the Responsible Test Laboratory (RTL) shall ensure that the Part Packaging test(s) are completed prior to starting the EVI test(s). This document is focused on EEE parts (herein may be referred to as “EEE parts” or “parts”). Although the examples in this document focus on microcircuits, this document applies to all EEE parts listed in the Applicability Matrix (Appendix A of AS6171 General Requirements). Specific evaluations may be required for certain parts that are not specified in this document; in those instances, this document can be used as a guide. Additional inspections or criteria should be developed and documented to evaluate these parts. The Test Laboratory shall be accredited to ISO/IEC 17025 in order to perform the test methods defined in this standard. In the ISO/IEC 17025 Scope Statement, the Test Laboratory shall indicate to which of the specific method(s) it is accredited, according to the following options: Option 1: All of the AS6171/2 Test Methods Option 2: General EVI (Method A), Detailed EVI (Method B), and Part Dimensions Measurement (Method E) Option 3: Testing for Remarking (Method C) and Testing for Resurfacing (Method D) If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements, shall also apply.

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