AS6171/3: Techniques for Suspect/Counterfeit EEE Parts Detection by X-ray Fluorescence Test Methods - SAE International
Browse Standards AS6171/3
Current ISSUED 2016-10-30

Techniques for Suspect/Counterfeit EEE Parts Detection by X-ray Fluorescence Test Methods AS6171/3

XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts.
If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
AS6171/3
2016-10-30
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