Browse Standards J1752/1_199703
Historical Issued 1997-03-01

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition J1752/1_199703

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752. The near field magnetic of electromagnetic radiation from an integrated circuit can be measured in a controlled manner that yields repeatable results. These emissions are related to the far field electromagnetic radiation potential of the IC and of the electronic module of which it is a part. The intent is to provide a quantitative measure of the RF emissions from ICs for comparison or other purposes. Similar quantitative measures of the immunity of an IC to RF fields and transients are being investigated.
J1752/1_201605
2016-05-24
Latest
Revised
J1752/1_200610
2006-10-13
Historical
Revised
J1752/1_199703
1997-03-01
Historical
Issued

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