Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions(STABILIZED Sep 2021)
J1752/1_202109
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
Rationale:
This technical report is being stabilized because it covers technology, products, or processes which are mature and not likely to change in the foreseeable future.
Related Topics:
Electromagnetic compatibility
Emissions measurement
Integrated circuits
Semiconductor devices
Noise measurement
Test procedures
Environmental testing
Also known as: SAE J 1752/1
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