J2052A: Test Device Head Contact Duration Analysis - SAE International
Browse Standards J2052_201607
Current STABILIZED 2016-07-12

Test Device Head Contact Duration Analysis(STABILIZED Jul 2016) J2052_201607

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
J2052_201607
2016-07-12
Latest
Stabilized
J2052_201101
2011-01-05
Historical
Revised
J2052_200512
2005-12-14
Historical
Reaffirmed
J2052_199712
1997-12-01
Historical
Revised
J2052_199003
1990-03-01
Historical
Issued

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