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AS6171/23 - Techniques for Suspect/Counterfeit EEE Assembly Detection by Various Test Methods

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Document Number: AS6171/23
Project Initiation: 2017-09-22 11:30:13.0
Project Number: AS6171/23
Revision Number:
Sponsor Name: Steve W. Walters
Title
Techniques for Suspect/Counterfeit EEE Assembly Detection by Various Test Methods
Scope
The intent of this test method is to describe high level processes to detect suspect/counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) Assemblies, covering both custom and military/commercial off-the-shelf (COTS) assemblies. This standard includes requirements for accreditation and certification of Laboratory and Laboratory personnel, and also, data collection, interpretation, and reporting as applicable to this test method. This standard covers EEE assemblies and includes electronic circuit card assemblies as defined under the definition for EEE Assembly and Electronic Circuit Card Assembly.
Rationale
This standard was created in response to a significant and increasing volume of Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts and assemblies entering the supply chain, posing significant performance, reliability, and safety risks. This standard is intended to provide guidance, practices and methods for evaluating vulnerabilities in EEE Assemblies in order to mitigate the risks of receiving or using SC EEE Assemblies.
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