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Technical Paper

A Discussion on the Effects and Mitigation of Single Event Upsets on Avionics Systems to Help in Developing Future Requirements

2011-10-04
2011-36-0256
Avionics Systems are increasingly used to perform safety-critical functions at high altitudes. But their increasing capacity and concentration of memory and logics leads to more frequent occurrences of single event upsets, especially in high altitudes. In this work we discuss the effects and mitigation of single event upsets on avionics systems to help in developing future requirements. To do that we initially present the concepts of radiation environment of the atmosphere, radiation induced errors, single event upsets, etc. Then, we discuss some of their effects on avionic systems and ways of mitigation. Finally, we discuss provisions to demand the adoption of such mitigation measures, and their sufficiency. This will help in developing future requirements to accomplish the objectives of a safe operation of civil transportation aircraft.
Technical Paper

An Overview of an Assurance Process of Immunity of Embedded Electronic Systems to Single Event Upsets Caused by Ionizing Particles

2013-10-07
2013-36-0535
The aerospace and automotive electronic systems are getting more complex and/or highly integrated, as defined by ARP 4754A, making extensive use of microelectronics and digital memories which, in turn, operates in higher frequencies and lower voltages. In addition, the aircraft are flying in higher altitudes, and polar routes are getting more frequent. These factors raise the probability of occurrence of hazardous effects like the Single Event Upsets in their embedded electronic systems. These must be designed in a way to tolerate and assure the immunity to the Single Event Upsets, based upon criteria such as reliability, availability and criticality. This paper proposes an overview of an assurance process of immunity of embedded electronic systems to Single Event Upsets caused by ionizing particles by means of a review of literature and an analysis of standards as ECSS-E-ST-10-1, NASA Single Event Effects Criticality Analysis and IEC TS 62396-1.
Technical Paper

A Discussion on the Process of Eliciting and Validating Requirements to Handle Single Event Upsets in Avionic Systems

2012-10-02
2012-36-0519
Avionics Systems are increasingly used to perform safety-critical functions at high altitudes. But their increasing capacity and concentration of memory and logics leads to more frequent occurrences of single event upsets, especially in high altitudes. In this work we discuss the process of eliciting and validating requirements to handle single events upsets in avionic systems. To do that we initially summarize and update the concepts of radiation environment of the atmosphere, radiation induced errors, single event upsets, etc. presented in a previous paper. Then, we discuss some of their effects on avionic systems and ways of mitigation, reported in the literature. Finally, we discuss provisions to demand the adoption of such mitigation measures, and their sufficiency by transforming them into requirements, according to recommendations of compliance described in standards as SAE ARP 4754A and RTCA DO-254.
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