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Technical Paper

Optical Metrology, the Key to Lean Manufacturing

2012-04-16
2012-01-0185
Optical metrology has long been a high performance research tool for scientists in the laboratory. Modern forms of photogrammetry are now supporting engineering and manufacturing measurements. These optical metrology tools provide rapid, full-field measurements that are easy to use, broadly applicable and directly comparable to today's computer models and simulations. 3D Photogrammetry is the basis of Digital Image Correlation, White Light Scanning and Dynamic Photogrammetry metrologies. This paper will discuss the real world engineering and manufacturing applications where these optical methods are providing a more precise and holistic measurement of materials, structures and operating machines. This precise, detailed knowledge is allowing direct solutions to problems and rapid, real-time comparison to engineering design. Like a team of engineers in a box, optical metrology is providing the tools to achieve lean manufacturing for better, more advanced products.
Technical Paper

Next Generation 3D Optical Measurements for Manufacturing

2005-04-11
2005-01-0490
Materials qualification, forming analysis, component and structural testing, advanced video metrology systems utilizing photogrammetry and image correlation provide robust full-field measurement capabilities for broad ranges of measurement applications. These advanced techniques of 3D image correlation (ARAMIS) for 3D deformation and strain measurement, photogrammetry (ARGUS) for automated forming analysis for manufactured parts and dynamic photogrammetry (PONTOS), are substantially more robust and provide a greater dynamic range than other technologies, and are simpler to use and less expensive to implement. The technologies are inherently three-dimensional, measuring total deformation of complex objects and their shape, rather than just relative deformation. The technology also has a much higher dynamic range of deformation measurement, which is particularly critical during dynamic deformation analysis such as during systems analysis, plastic deformation and defect propagation.
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