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Natural atmospheric radiation effects have been recognized in recent years as key safety and reliability concerns for avionics systems. Atmospheric radiation may cause Single Event Effects (SEE) in electronics. The resulting Single Event Effects can cause various fault conditions, including hazardous misleading information and system effects in avionics equipment. As technology trends continue to achieve higher densities and lower voltages, semiconductor devices are becoming more susceptible to atmospheric radiation effects. To ensure a system meets all its safety and reliability requirements, SEE induced upsets and potential system failures need to be considered. The purpose of this paper is to describe a process to incorporate the SEE analysis into the development like-cycle. Background on the atmospheric radiation phenomenon and the resulting single event effects, including single event upset (SEU) and latch up conditions is provided.

The purpose of the Los Alamos High-Energy Neutron Testing Handbook is to provide user information and guidelines for testing Integrated Circuits (IC) and electronic systems at the Irradiation of Chips and Electronics (ICE) Houses at the Los Alamos Neutron Science Center (LANSCE) at Los Alamos National Laboratory (LANL). Microelectronic technology is constantly advancing to higher density, faster devices and lower voltages. These factors may increase device susceptibility to radiation effects. The high-energy neutron source at LANSCE/LANL provides the capability for accelerated neutron testing of semiconductor devices and electronic systems and to simulate effects in various neutron environments.