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EMC Component Validation Responsibilities encompass many realms. One of these realms is the effect of magnetic fields on silicon-based devices. This article describes a method for exposing these devices to magnetic fields with waveforms other than the traditional sinusoidal excitation. The method commonly used to explore the sensitivity of active silicon devices is exposure of the device to a representative sinusoidal field and observation of its reaction or lack thereof. The challenge is to characterize the representative field and be able to verify its effectiveness. Recent vehicle level testing of new designs has brought our attention to time-varying or transient magnetic field shapes that create deviations not previously detected with Military Standard 461 (MIL-STD-461) type sinusoidal magnetic field exposure.

The automotive industry has increased reliance on electronics technology and wireless communication systems and the demand for these systems is still increasing. With this demand there is a need to ensure these systems do not interfere with each other in a way which may cause system performance degradation or even failure. Electromagnetic compatibility (EMC) is a discipline that deals with interaction between electronic and wireless systems. During EMC testing the device under test (DUT) is isolated from the surrounding environment to facilitate measurement of the component’s electromagnetic characteristics. Geometric aspects of an EMC test setup may impact test results without the knowledge of the test engineer. In this paper, electromagnetic simulation and measurement results will show the impact of one of the least obvious but most often experienced issues in an EMC setup - grounding.