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A method is proposed to estimate a spectral response of surface materials through experimental data of temperature dependence of total hemispherical emittance. This method is applied to experimental data obtained for polyimide films with four different kinds of thickness, and the results of their spectral response estimated are shown.

Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.