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All dimensional measurement systems, including Coordinate Measuring Machines (CMMs), share certain common characteristic elements. These systems include one or more of the following items: a sensor, a mechanism for supporting the sensor, a device for moving the support mechanism, a technique for planning how the support mechanism will be moved, and a device for analyzing sensor data. By recognizing these common features and capitalizing on the benefits of modularity and interchangeability of these features, the next generation of measuring machines will be able to easily accommodate new sensor technology and to meet the changing demands placed on dimensional inspection processes quickly and cost effectively.