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Infineon's latest high-end automotive microcontrollers like TC1796 are complex Systems On Chip (SoC) with two processor cores and up to two internal multi-master buses. The complex interaction between cores, peripherals and environment provides a big challenge for debugging. For mission critical control like engine management the debugging approach must not be intrusive. The provided solution are dedicated Emulation Devices which are able to deal with several 10 Gbit/s of raw internal trace data with nearly no cost adder for mass production and system design. Calibration, which is used later in the development cycle, has different requirements, but is covered by the Emulation Devices as well. The architecture of TC1796ED comprises the unchanged TC1796 silicon layout, extended by a full In-Circuit Emulator (ICE) and calibration overlay memory on the same die. In most cases, the only debug/calibration tool hardware needed is a USB cable.

In terms of modern technical systems, the automotive sector is characterized by escalating complexity and functionality requirements. The development of embedded control systems has to meet highest demands regarding process-, time- and cost-optimization. Hence, the efficiency of software development becomes a crucial competitive advantage. Systems design engineers need effective tools and methods to achieve exemplary speed and productivity within the development phase. To obtain such tools and methods, semiconductor manufacturers and tool manufacturers must work closely together. Within the joint efforts of ETAS and Infineon, the software tool suite ASCET-SD was enhanced to generate efficient C code for Infineon's TriCore architecture mapped on ETAS's real-time operating system ERCOSEK. The processor interface to application & calibration tools was realized using the ETK probe based on a JTAG/Nexus link at very high bandwidth.

The increasingly stringent requirements in relation to safety, fuel economy, emission reduction, and onboard diagnostics are pushing the automotive industry toward more innovative solutions and a rapid increase in microcontroller performance. This paper will list the key factors necessary to increase overall data throughput and provide the right features to satisfy the coming drivetrain requirements. The paper will address different aspects such as: microcontroller architecture, cores, memories, silicon technologies, assembly / packaging, and development tools. It will also present techniques to improve modularity, scalability and configurability that will offer a migration path to permit the evolution and even revolution of drivetrain electronics. Since quality and reliability requirements are among the most stringent of any application fields, the paper will outline the path to reach zero-defect products.