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It has the aim to discuss the evolution of electronics components, integrated circuits, new transistors concepts and associate its importance in the automotive modules. Today, the challenge is to have devices which consume less power, suitable for high-energy radiation environment, less parasitic capacitances, high speed, easier device isolation, high gain, easier scale-down of threshold voltage, no latch-up and higher integration density. The improvement of those characteristics mentioned and others in the electronic devices enable the automotive industry to have a more robust product and give the possibility to integrate new features in comfort, safety, infotainment and telematics modules. Finally, the intention is to discuss advanced structures, such as the silicon-on-insulator (SOI) and show how it affects the electronics modules applied for the automotive area.

This paper describes how new transistors layouts can mitigate failures Induced by atmospheric radiation, focusing on the total ionizing dose (TID) effects. By conducting an experimental comparative study of the TID effects between the Metal-Oxide-Semiconductor Field Effect Transistor (MOSFET) manufactured with new layouts proposals and the standard layout (Conventional), for devices exposed to 10 keV X-ray irradiation using a Shimadzu XRD-7000 equipment, this paper suggests a new approach of layouts to have a better performance in radiation environment with low cost impact, lower power consumption, more speed and they could keep robustness and reliability.

The detailed study of cosmic ray's influence is recent, as well as the invention of the transistor. Ionizing particles from space that focus on silicon integrated circuits (IC) can cause many undesirable effects. These particles are mainly from solar activity, and can be classified into two basic groups: charged particles, e.g, electrons, protons or heavy ions, and electromagnetic radiation (photons), as X-rays, Gamma -rays, or Ultraviolet (UV) light. When they collide in an IC, these energetic particles cause a current pulse, which can affect the correct functioning of the device. These electronic circuits have become increasingly susceptible to the effects of radiation, due to miniaturization, thus increasing the incidence of failures.