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This document has been formulated as a suggested guide in assisting EIA Engineering Department Panels and JEDEC Councils in cooperating with the Defense Department and other Federal agencies in the preparation of suggested reliability requirements for various types of electronic products as part of a program designed to enhance the reliability of defense and related equipment. The document is to be followed merely as a guide and is not intended to limit technical groups in the consideration of the factors to be taken into account in the development of reliability specifications for recommendation to the Government.

Conventional attribute sampling plans based upon nonzero acceptance numbers are no longer desirable. In addition, emphasis is now placed on the quality level that is received by the customer. This relates directly to the Lot Tolerance Percent Defective (LTPD) value or the Limiting Quality Protection of MIL-STD-105. Measuring quality levels in percent nonconforming, although not incorrect, has been replaced with quality levels measured in parts per million (PPM). As a result, this standard addresses the need for sampling plans that can augment MIL-STD-105, are based upon a zero acceptance number, and address quality (nonconformance) levels in the parts per million range. This document does not address minor nonconformances, which are defined as nonconformances that are not likely to reduce materially the usability of the unit of product for its intended purpose.