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Standard

Immunity to Conducted Transients on Power Leads

2023-03-20
J1082_202305
This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).
Standard

Immunity to Conducted Transients on Power Leads

2023-03-20
J1113/11_202303
This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields

2022-09-30
J551/16_202209
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
Standard

Immunity to Conducted Transients on Power Leads

2018-12-10
J1113/11_201812
This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields

2017-10-10
J551/16_201710
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2017-09-22
J1752/3_201709
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Immunity to Conducted Transients on Power Leads

2017-06-13
J1113/11_201706
This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2016-09-16
J1752/2_201609
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields

2012-05-11
J551/16_201205
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
Standard

Immunity to Conducted Transients on Power Leads

2012-01-30
J1113/11_201201
This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2011-06-24
J1752/2_201106
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2011-06-17
J1752/3_201106
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Electromagnetic Compatibility—Component Test Procedure—Part 42—Conducted Transient Emissions

2010-12-08
J1113/42_201012
This SAE Standard defines a component-level test procedure to evaluate automotive electrical and electronic components for Conducted Emissions of transients, and for other electromagnetic disturbances, along battery feed (B+) or switched ignition inputs of a Device Under Test (DUT). Test apparatus specifications outlined in this procedure were developed for components installed in the 12-V passenger cars, light trucks, 12 V heavy-duty trucks, and vehicles with 24 V systems.
Standard

ELECTROMAGNETIC SUSCEPTIBILITY MEASUREMENT PROCEDURES FOR VEHICLE COMPONENTS (EXCEPT AIRCRAFT)

1987-08-01
J1113_198708
This SAE Recommended Practice establishes uniform laboratory measurement techniques for the determination of the susceptibility to undesired electromagnetic sources of electrical, electronic, and electromechanical ground-vehicle components. It is intended as a guide toward standard practice, but may be subject to frequent change to keep pace with experience and technical advances, and this should be kept in mind when considering its use.
Standard

ELECTROMAGNETIC SUSCEPTIBILITY PROCEDURES FOR VEHICLE COMPONENTS (EXCEPT AIRCRAFT)

1984-06-01
J1113_198406
This SAE Recommended Practice establishes uniform laboratory measurement techniques for the determination of the susceptibility to undesired electromagnetic sources of electrical, electronic, and electromechanical ground-vehicle components. It is intended as a guide toward standard practice, but may be subject to frequent change to keep pace with experience and technical advances, and this should be kept in mind when considering its use.
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