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Semiconductor devices in electric vehicle (EV) motor drive systems are considered the most fragile components with a high occurrence rate for open circuit fault (OCF). Various signal-based and model-based methods with explicit mathematical models have been previously published for OCF diagnosis. However, this proposed work presents a model-free machine learning (ML) approach for a single-switch OCF detection and localization (DaL) for a two-level, three-phase inverter. Compared to already available ML models with complex feature extraction methods in the literature, a new and simple way to extract OCF feature data with sufficient classification accuracy is proposed. In this regard, the inherent property of active thermal management (ATM) based model predictive control (MPC) to quantify the conduction losses for each semiconductor device in a power converter is integrated with an ML network.

The application of power electronic converters (PEC) in electric vehicles (EVs) has increased immensely as they provide enhanced controllability and flexibility to these vehicles. Accordingly, the interest in developing innovative and sustainable technologies to ensure safe and reliable operation of PECs has also risen. One of the most difficult challenges experienced during the development of reliable PECs is the design of proper thermal management systems for controlling the junction temperature and reducing the thermal cycling of power semiconductors. The addition of Active Thermal Control (ATC) can mitigate these concerns. Moreover, the performance of the thermal management system can be enhanced further by the integration of active cooling methods. An active cooling system consumes external energy for circulating cooling air or liquid within the PECs.