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Journal Article

A Fresh Look at Radiation Exposures from Major Solar Proton Events

2008-06-29
2008-01-2164
Solar proton events (SPEs) represent the single-most significant source of acute radiation exposure during space missions. Historically, an exponential in rigidity (particle momentum) fit has been used to express the SPE energy spectrum using GOES data up to 100 MeV. More recently, researchers have found that a Weibull fit better represents the energy spectrum up to 1000 MeV (1 GeV). In addition, the availability of SPE data extending up to several GeV has been incorporated in analyses to obtain a more complete and accurate energy spectrum representation. In this paper we discuss the major SPEs that have occurred over the past five solar cycles (~50+ years) in detail - in particular, Aug 1972 and Sept & Oct 1989 SPEs. Using a high-energy particle transport/dose code, radiation exposure estimates are presented for various thicknesses of aluminum. The effects on humans and spacecraft systems are also discussed in detail.
Technical Paper

Improvement of Risk Assessment from Space Radiation Exposure for Future Space Exploration Missions

2007-07-09
2007-01-3116
Protecting astronauts from space radiation exposure is an important challenge for mission design and operations for future exploration-class and long-duration missions. Crew members are exposed to sporadic solar particle events (SPEs) as well as to the continuous galactic cosmic radiation (GCR). If sufficient protection is not provided the radiation risk to crew members from SPEs could be significant. To improve exposure risk estimates and radiation protection from SPEs, detailed evaluations of radiation shielding properties are required. A model using a modern CAD tool ProE™, which is the leading engineering design platform at NASA, has been developed for this purpose. For the calculation of radiation exposure at a specific site, the cosine distribution was implemented to replicate the omnidirectional characteristic of the 4π particle flux on a surface.
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