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Technical Paper

BIST Based Method for SEE Testing of Vikram1601 Processor

2024-06-01
2024-26-0433
A novel method for Single Event Effect (SEE) Radiation Testing using Built-In Self-Test (BIST) feature of indigenously developed Vikram1601 processor is discussed. The novelty is that the usage of BIST avoids need of exhaustive test vectors to ensure test coverage of all the internal registers and physical memory to store them. So processor is the only element vulnerable to radiation damage during testing. The test design was carried out at VSSC, Trivandrum and the testing was carried out at IUAC, Delhi. In the first part, a brief introduction, need and methods of radiation testing of electronics especially SEE of radiation on Silicon based devices, different radiation effects, radiation damage mechanisms and testing methods are described. A brief introduction to Vikram1601 processor, the instruction – TST, used as BIST and testing scheme implementation using TST for studying the SEE is explained.
Standard

Test Method for the Determination of Total Acidity in Polyol Ester and Diester Gas Turbine Lubricants by Automatic Potentiometric Titration

2024-03-18
ARP5088C
The test method describes the procedure for determination of the total acid number (TAN) of new and degraded polyol ester and diester-based gas turbine lubricants by the potentiometric titration technique. The method was validated to cover an acidity range of 0.05 to 6.0 mg KOH g-1. The method may also be suitable for the determination of acidities outside of this range and for other classes of lubricants.
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