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This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.

This SAE Standard defines a component-level test procedure to evaluate automotive electrical and electronic components for Conducted Emissions of transients, and for other electromagnetic disturbances, along battery feed (B+) or switched ignition inputs of a Device Under Test (DUT). Test apparatus specifications outlined in this procedure were developed for components installed in the 12-V passenger cars, light trucks, 12 V heavy-duty trucks, and vehicles with 24 V systems.