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Standard

Vehicle Electromagnetic Immunity--On-Board Transmitter Simulation

1994-03-01
HISTORICAL
J551/12_199403
This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity--On-Board Transmitter Simulation

1996-09-01
HISTORICAL
J551/12_199609
This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity--On-Board Transmitter Simulation

2009-08-03
CURRENT
J551/12_200908
This part of SAE J551 specifies on-board transmitter simulation test methods and procedures for testing passenger cars and commercial vehicles. The electromagnetic disturbances considered in this part of SAE J551 are limited to continuous narrow band electromagnetic fields. SAE J551/1 specifies general, definitions, practical use, and basic principles of the test procedure.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2017-09-22
CURRENT
J1752/3_201709
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2011-06-17
HISTORICAL
J1752/3_201106
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
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