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Technical Paper

Tracking Panel Movement during Stamping Process Using Advanced Optical Technology

2020-04-14
2020-01-0541
Metal panels are comprehensively applied in the automotive industry. A significant issue with metal panels is the deflection when moving in the press line of the stamping process. Unpredictable deflection could result in the cut off of the press line. To control the deflection in a safe zone, finite element tools are used to simulate the panel transform process. However, the simulation requires experimental validation where conventional displacement measurement techniques could not satisfy the requirement of vast filed displacement and accuracy point tracking. In this study, multi-camera digital image correlation (DIC) systems have been developed to track the movement of panels during the press line of the stamping process. There are some advantages of applying the DIC system, including non-contact, full-field, high accuracy, and direct measurement techniques that provide the evaluation displacement of the metal panel and press line.
Journal Article

Review and Comparison of Different Multi-Channel Spatial-Phase Shift Algorithms of Electronic Speckle Pattern Interferometry

2021-04-06
2021-01-0304
Electronic Speckle Pattern Interferometry (ESPI) is the most sensitive and accurate method for 3D deformation measurement in micro and sub micro-level. ESPI measures deformation by evaluating the phase difference of two recorded speckle interferograms under different loading conditions. By a spatial phase shift technique, ESPI allows for the rapid, accurate and continuous 3D deformation measurement. Multi-channel and carrier frequency are the two main methods of spatial phase shift. Compared with carrier frequency method, which is subject to the problem of spectrum aliasing, multi-channel method is more flexible in use. For extracting the phase value of speckles, four-step algorithm and five-step arbitrary phase algorithm are commonly used. Different algorithms have different spatial resolution, operational requirements, and phase image quality.
Journal Article

Suction Cup Quality Predication by Digital Image Correlation

2023-04-11
2023-01-0067
Vacuum suction cups are used as transforming handles in stamping lines, which are essential in developing automation and mechanization. However, the vacuum suction cup will crack due to fatigue or long-term operation or installation angle, which directly affects production productivity and safety. The better design will help increase the cups' service life. If the location of stress concentration can be predicted, this can prevent the occurrence of cracks in advance and effectively increase the service life. However, the traditional strain measurement technology cannot meet the requirements of tracking large-field stains and precise point tracking simultaneously in the same area, especially for stacking or narrow parts of the suction cups. The application must allow multiple measurements of hidden component strain information in different fields of view, which would add cost.
Journal Article

Development of Digital Shearography for Dual Sensitivity Simultaneous Measurement Using Carrier Frequency Spatial Phase Shift Technology

2023-04-11
2023-01-0068
Digital shearography has many advantages, such as full-field, non-contact, high sensitivity, and good robustness. It was widely used to measure the deformation and strain of materials, also to the application of nondestructive testing (NDT). However, most digital sherography applications can only work in one field of view per measurement, and some small defects may not be detected as a result. Multiple measurements of different fields of view are needed to solve this issue, which will increase the measurement time and cost. The difficulty in performing multiple measurements may also increase for cases where the loading is not repeatable. Therefore, a system capable of measuring dual fields of view at the same time is necessary. The carrier frequency spatial phase shift method may be a good candidate to reach this goal because it can simultaneously record phase information of multiple images, e.g. two speckle interferograms with different fields of view.
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