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Technical Paper

Measurement of Aluminum Edge Stretching Limit Using 3D Digital Image Correlation

2015-04-14
2015-01-0594
This paper introduces an industrial application of digital image correlation technique on the measurement of aluminum edge stretching limit. In this study, notch-shape aluminum coupons with three different pre-strain conditions are tested. The edge stretching is proceeded by standard MTS machine. A dual-camera 3D Digital Image Correlation (DIC) system is used for the full field measurement of strain distribution in the thickness direction. Selected air brush is utilized to form a random distributed speckle pattern on the edge of sheet metal. A pair of special optical lens systems are used to observe the small measurement edge area. From the test results, it demonstrate that refer to the notched coupon thickness, pre-tension does not affect the fracture limit; refer to the virgin sheet thickness, the average edge stretch thinning limits show a consistent increasing trend as the pre-stretch strain increased.
Journal Article

Development of Digital Shearography for Dual Sensitivity Simultaneous Measurement Using Carrier Frequency Spatial Phase Shift Technology

2023-04-11
2023-01-0068
Digital shearography has many advantages, such as full-field, non-contact, high sensitivity, and good robustness. It was widely used to measure the deformation and strain of materials, also to the application of nondestructive testing (NDT). However, most digital sherography applications can only work in one field of view per measurement, and some small defects may not be detected as a result. Multiple measurements of different fields of view are needed to solve this issue, which will increase the measurement time and cost. The difficulty in performing multiple measurements may also increase for cases where the loading is not repeatable. Therefore, a system capable of measuring dual fields of view at the same time is necessary. The carrier frequency spatial phase shift method may be a good candidate to reach this goal because it can simultaneously record phase information of multiple images, e.g. two speckle interferograms with different fields of view.
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