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The efforts of the ISO “Test Variability Task Force” have been aimed at improving the understanding and at reducing brake dynamometer test variability during performance testing. In addition, dynamometer test results have been compared and correlated to vehicle testing. Even though there is already a vast amount of anecdotal evidence confirming the fact that different procedures generate different friction coefficients on the same brake corner, the availability of supporting data to the industry has been elusive up to this point. To overcome this issue, this paper focuses on assessing friction levels, friction coefficient sensitivity, and repeatability under ECE, GB, ISO, JASO, and SAE laboratory friction evaluation tests.

Reductions of hardware costs as well as implementations of new innovative functions are the main drivers of today's automotive electronics. Indeed more and more resources are spent on adapting existing solutions to different environments. At the same time, due to the increasing number of networked components, a level of complexity has been reached which is difficult to handle using traditional development processes. The automotive industry addresses this problem through a paradigm shift from a hardware-, component-driven to a requirement- and function-driven development process, and a stringent standardization of infrastructure elements. One central standardization initiative is the AUTomotive Open System ARchitecture (AUTOSAR). AUTOSAR was founded in 2003 by major OEMs and Tier1 suppliers and now includes a large number of automotive, electronics, semiconductor, hard- and software companies.

This paper describes the first single-core 32-bit microcontroller-DSP architecture, TriCore, optimized for real-time embedded systems, an OSEK/VDX Real-Time Operating System (RTOS) and an open, integrated development tools platform to allow a development downflow for high-level Computer Aided Software Engineering (CASE) design entry and simulation/validation, rapid prototyping down to the target hardware for calibration and debugging and the up-flow by feeding the data collected from the target Electronic Control Unit (ECU) for system analysis and debugging all the way back to the entry CASE level. Also described are the different features of the new 32-Bit microcontroller-DSP, which speeds up the execution of embedded control applications and simultaneously reduce memory demand.