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The CDIF Family of Standards is primarily designed to be used as a description of a mechanism for transferring information between CASE tools. It facilitates a successful transfer when the authors of the importing and exporting tools have nothing in common except an agreement to conform to CDIF. The language that is defined for the Transfer Format also has applicability as a general language for Import/Export from repositories. The CDIF Integrated Meta-model defined for CASE also has applicability as the basis of standard definitions for use in repositories. The standards that form the complete family of CDIF Standards are documented in EIA/IS-106 CDIF - CASE Data Interchange Format - Overview. These standards cover the overall framework, the transfer format and the CDIF Integrated Meta-model. The diagram in Figure 1 depicts the various standards that comprise the CDIF Family of Standards. The shaded box depicts this Standard and its position in the CDIF Family of Standards.

This document has been formulated as a suggested guide in assisting EIA Engineering Department Panels and JEDEC Councils in cooperating with the Defense Department and other Federal agencies in the preparation of suggested reliability requirements for various types of electronic products as part of a program designed to enhance the reliability of defense and related equipment. The document is to be followed merely as a guide and is not intended to limit technical groups in the consideration of the factors to be taken into account in the development of reliability specifications for recommendation to the Government.

This Specification covers a statistical sampling plan for lot inspection by attributes. It verifies that the customer's specified quality level (SQL) is not being exceeded. The estimate of fraction nonconforming determined by EIA Interim Standard No. EIA-554 is used to select the optimum sample plan for verifying that a given lot meets the specified quality level (SQL).

This Assessment Guide is applicable to any assessment technique that wishes to embrace the principles and concepts presented in the EIA-599 National Electronic Process Certification Standard.

The scope of this Standard is the definition of the response of a numerically controlled machine to a valid sequence of records made up of 32 bit binary words or ASCII text strings. The Standard defines the structure of these records and of the 32 bit binary words or ASCII text strings which make up the records. This standard addresses the control of machines capable of performing 2, 3, 4, and 5 axis motion of an active tool (mill, laser, pen, etc.) relative to a part, and those capable of 2 and 4 axis tool motion relative to a rotating part (turning machines), including parallel tool slide sets capable of concurrent (merged) motion.

Conventional attribute sampling plans based upon nonzero acceptance numbers are no longer desirable. In addition, emphasis is now placed on the quality level that is received by the customer. This relates directly to the Lot Tolerance Percent Defective (LTPD) value or the Limiting Quality Protection of MIL-STD-105. Measuring quality levels in percent nonconforming, although not incorrect, has been replaced with quality levels measured in parts per million (PPM). As a result, this standard addresses the need for sampling plans that can augment MIL-STD-105, are based upon a zero acceptance number, and address quality (nonconformance) levels in the parts per million range. This document does not address minor nonconformances, which are defined as nonconformances that are not likely to reduce materially the usability of the unit of product for its intended purpose.

This Standard is applicable to suppliers of electronic components, assemblies, equipment and related materials. This standard establishes the general requirements to achieve a certified process. The use of this standard is intended for any manufacturing or service company whose goal is to achieve customer satisfaction through continuous improvement.

This style manual establishes requirements for the preparation of standards1) and certain other publications of TechAmerica. It also gives some indication with regard to presentation.

The procedure outlined in this document is applicable to any manufacturing or service process. It may be used on part of a process or and entire process or a series of sequential processes.

This standard is intended to provide guidance for selecting standardized methods for estimating the proportion nonconforming expressed as PPM. These methods are contained in EIA 554-1, EIA 554-2 and EIA 591.

The general requirements of an SPC system shall encompass, but are not limited to, the following elements: a Overall quality system b Management commitment c SPC system documentation d Critical process nodes e Gage characterization and capability f Process characterization and capability g Control system documentation h On-line/off-line control i Training j Supplier SPC systems k Calibration l Preventive maintenance m Self audit

The CDIF Family of Standards is primarily designed to be used as a description of a mechanism for transferring information between CASE tools. It facilitates a successful transfer when the authors of the importing and exporting tools have nothing in common except an agreement to conform to CDIF. The CDIF Family of Standards includes an Integrated Meta-model and a Transfer Format definition. It also includes the specification of a meta-meta-model and associated rules that define a framework for the Integrated Meta-model and the Transfer Format. The language that is defined for the Transfer Format also has applicability as a general language for Import/Export for repositories. The CDIF Integrated Meta-model also has applicability as the basis of standard definitions for use in repositories. The diagram in Figure 1 depicts the various standards that comprise the CDIF Family of Standards. The shaded box depicts this Standard and its position in the CDIF Family of Standards.

(From Standards Proposal No. 2358, formulated under the cognizance of the EIA Quality and Reliability Engineering (QRE) Committee.)