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This document describes a process for use by ADHP integrators of EEE parts and sub-assemblies (items) that have been targeted for other applications. This document does not describe specific tests to be conducted, sample sizes to be used, nor results to be obtained; instead, it describes a process to define and accomplish application-specific qualification; that provides confidence to both the ADHP integrators, and the integrators’ customers, that the item will performs its function(s) reliably in the ADHP application.

This document describes a process for use by ADHP integrators of EEE parts and sub-assemblies (items) that have been targeted for other applications2. This document does not describe specific tests to be conducted, sample sizes to be used, nor results to be obtained; instead, it describes a process to define and accomplish application-specific qualification; that provides confidence to both the ADHP integrators, and the integrators’ customers, that the item will performs its function(s) reliably in the ADHP application.

This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in ADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the ADHP equipment to assess those designs and mitigations. This document focuses on the LLM wearout assessment process. It acknowledges that the ADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.

This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations. This document focuses on the LLM wearout assessment process. It acknowledges that the AADHP system design process also includes related risk mitigation and management; however, this document includes only high-level reference and discussion of those topics, in order to show their relationship to the LLM assessment process.

This ARP is not a certification document; it contains no certification requirements beyond those already contained in existing certification documents. The purpose of this ARP is to provide more detailed descriptions of the 12 hardware-related COTS issues listed in Appendix B, and to provide recommendations on existing practices, processes, and methods to address them. This ARP also describes artifacts that may be used as evidence that the issues have been addressed. The recommended practices and artifacts may be used to facilitate communication between, for example, the provider and the user of the avionics systems into which COTS components are integrated, or between the applicant for certification and the certification body. This ARP does not claim that the recommended practices and artifacts described in this ARP are the only acceptable ones.

This Standard applies to integrated circuits and semiconductors exhibiting the following attributes: a A minimum set of requirements, or information provided by the part manufacturer, which will allow a standard COTS component to be designated AQEC by the manufacturer. b As a minimum, each COTS component (designated AQEC) will have been designed, fabricated, assembled, and tested in accordance with the component manufacturer’s requirements for standard data book components. c Qualification of, and quality systems for, the COTS components to be designated as AQEC shall include the manufacturer’s standards, operating procedures, and technical specifications. d Components manufactured before the manufacturer has addressed AQEC requirements, but utilizing the same processes, are also considered AQEC compliant. e Additional desired attributes of a device designated AQEC (that will support AQEC users) are found in Appendix B of this standard.