This report describes a method of semiconductor resistance measurement using controlled energy levels and a digital processing oscilloscope to acquire and process test data.
This report describes basic method for measurement of spark energy on all types of capacitance discharge exciters. Reference is made to other methods which may be used if limitations are observed.
These specifications contain general information pertaining to the sparking voltage parameter of shunted surface gap spark igniters; test equipment circuitry; bill of materials for test equipment; test equipment operation.