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This SAE Information Report defines the test methods and specifications for the electrostatic discharge sensitivity of passenger cars, multipurpose passenger vehicles, trucks and buses.

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Standard defines a component-level test procedure to evaluate automotive electrical and electronic components for Conducted Emissions of transients, and for other electromagnetic disturbances, along battery feed (B+) or switched ignition inputs of a Device Under Test (DUT). Test apparatus specifications outlined in this procedure were developed for components installed in the 12-V passenger cars, light trucks, 12 V heavy-duty trucks, and vehicles with 24 V systems.

This SAE Standard specifies the test methods and procedures for testing passenger cars and commercial vehicles to magnetic fields generated by power transmission lines and generating stations. SAE J551-1 specifies general information, definitions, practical use, and basic principles of the test procedure.

This SAE Standard specifies the test methods and procedures for testing passenger cars and commercial vehicles to magnetic fields generated by power transmission lines and generating stations. SAE J551-1 specifies general information, definitions, practical use, and basic principles of the test procedure.

This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.

This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.

This SAE Standard specifies the ESD test methods and procedures necessary to evaluate electronic modules intended for vehicle use. It describes test procedures for evaluating electronic modules in complete vehicles. A procedure for verifying the simulator that is used to generate the electrostatic discharges is given in Appendix A. Functional status classifications for immunity to ESD are given in Appendix B.

This SAE Recommended Practice covers the recommended testing techniques for the determination of electric field immunity of an automotive electronic device when the device and its wiring harness is exposed to a power line electric field. This technique uses a parallel plate field generator and a high voltage, low current voltage source to produce the field.

This document is an SAE Standard and covers the requirements for determining the immunity characteristics of automotive electronic equipment, subsystems, and systems to EM energy injected individually onto each lead. This test may be used over the frequency range of 15 Hz to 250 kHz. The method is applicable to all input, output, and power leads. The method is particularly useful in evaluating DUTs with acoustic or visible display functions.

Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.

This document establishes a method for characterizing the design margins and compatibility of electronic devices and equipment used in vehicles to various voltage fluctuations and transients over temperature.

This document establishes methods for characterizing the robustness of vehicle electronic modules to certain environmental stresses. They include: Voltage-Temperature Design Margins Voltage Interruptions-Transients Over Temperature Voltage Dips Current Draw Under a Number of Conditions These methods can be applied during Development, Pre-Qualification, Qualification or for Conformity. This document does not address other environmental robustness stresses such as vibration, high temp exposure, load faults, ESD, etc.

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g. Pre-Qualification, Qualification or Conformity).

The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).

This SAE Standard defines methods and apparatus to evaluate electronic devices for immunity to potential interference from conducted transients along battery feed or switched ignition inputs. Test apparatus specifications outlined in this procedure were developed for components installed in vehicles with 12-V systems (passenger cars and light trucks, 12-V heavy-duty trucks, and vehicles with 24-V systems). Presently, it is not intended for use on other input/output (I/O) lines of the device under test (DUT).

This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented – Capacitive Coupling Clamp, Chattering Relay, Direct Capacitor Coupling, and Inductive Coupling Clamp.

This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Two test methods are presented - Coupling Clamp and Chattering Relay.