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Standard

Electromagnetic Compatibility—Component Test Procedure—Part 42—Conducted Transient Emissions
2010-12-08
CURRENT
J1113/42_201012
This SAE Standard defines a component-level test procedure to evaluate automotive electrical and electronic components for Conducted Emissions of transients, and for other electromagnetic disturbances, along battery feed (B+) or switched ignition inputs of a Device Under Test (DUT). Test apparatus specifications outlined in this procedure were developed for components installed in the 12-V passenger cars, light trucks, 12 V heavy-duty trucks, and vehicles with 24 V systems.
Standard

Vehicle Electromagnetic Immunity—Power Line Magnetic Fields
2010-01-07
HISTORICAL
J551/17_201001
This SAE Standard specifies the test methods and procedures for testing passenger cars and commercial vehicles to magnetic fields generated by power transmission lines and generating stations. SAE J551-1 specifies general information, definitions, practical use, and basic principles of the test procedure.
Standard

Vehicle Electromagnetic Immunity - Power Line Magnetic Fields
2015-07-22
CURRENT
J551/17_201507
This SAE Standard specifies the test methods and procedures for testing passenger cars and commercial vehicles to magnetic fields generated by power transmission lines and generating stations. SAE J551-1 specifies general information, definitions, practical use, and basic principles of the test procedure.
Standard

Electromagnetic Compatibility Measurement Procedure for Vehicle Components - Immunity to AC Power Line Electric Fields
2021-12-13
CURRENT
J1113/26_202112
This SAE Recommended Practice covers the recommended testing techniques for the determination of electric field immunity of an automotive electronic device when the device and its wiring harness is exposed to a power line electric field. This technique uses a parallel plate field generator and a high voltage, low current voltage source to produce the field.
Standard

Electromagnetic Compatibility Measurement Procedure for Vehicle Components - Immunity to AC Power Line Electric Fields
2014-04-16
HISTORICAL
J1113/26_201404
This SAE Recommended Practice covers the recommended testing techniques for the determination of electric field immunity of an automotive electronic device when the device and its wiring harness is exposed to a power line electric field. This technique uses a parallel plate field generator and a high voltage, low current voltage source to produce the field.
Standard

Electromagnetic Compatibility Measurement Procedures and Limits for Vehicle Components (Except Aircraft)—Conducted Immunity, 15 Hz to 250 kHz—All Leads
2010-08-06
CURRENT
J1113/2_201008
This document is an SAE Standard and covers the requirements for determining the immunity characteristics of automotive electronic equipment, subsystems, and systems to EM energy injected individually onto each lead. This test may be used over the frequency range of 15 Hz to 250 kHz. The method is applicable to all input, output, and power leads. The method is particularly useful in evaluating DUTs with acoustic or visible display functions.
Standard

Electromagnetic Compatibility Measurements Procedure for Vehicle Components - Part 27: Immunity to Radiated Electromagnetic Fields - Mode Stir Reverberation Method
2023-03-23
CURRENT
J1113/27_202303
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. The reverberation method is used to evaluate the immunity of electronic devices in the frequency range of 500 MHz to 2.0 GHz, with possible extensions to 200 MHz and 10 GHz, depending upon chamber size and construction. Optional pulse modulation testing at HIRF (High Intensity Radiated Fields) test levels, based upon currently known environmental threats, has been added to this revision of the standard. This document addresses the Mode Stir (Continuous Stirring) Reverberation testing method which has been successfully utilized as a design and production stage development tool for many years. The Mode Tuned (Stepped Tuner) Reverberation testing method is covered in the SAE J1113-28 document.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
2016-09-16
CURRENT
J1752/2_201609
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
2011-06-24
HISTORICAL
J1752/2_201106
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Function Performance Status Classification for EMC Immunity Testing
2007-05-14
HISTORICAL
J1812_200705
This SAE Standard provides a general method for defining the acceptable function performance status classification for the functions of automotive electronic devices upon application of the test conditions specified as described in appropriate EMC immunity test standards (for example, SAE J1113 and SAE J551). Testing of devices could be performed either on or off vehicles. Appropriate test signal and methods, Function Performance status, and test signal severity level would have to be specified in the individual cases.
Standard

Conducted Immunity—Design Margins and Characterization
2002-08-05
HISTORICAL
J2628_200208
This document establishes a method for characterizing the design margins and compatibility of electronic devices and equipment used in vehicles to various voltage fluctuations and transients over temperature.
Standard

Characterization, Conducted Immunity
2005-04-29
HISTORICAL
J2628_200504
This document establishes methods for characterizing the robustness of vehicle electronic modules to certain environmental stresses. They include: Voltage-Temperature Design Margins Voltage Interruptions-Transients Over Temperature Voltage Dips Current Draw Under a Number of Conditions These methods can be applied during Development, Pre-Qualification, Qualification or for Conformity. This document does not address other environmental robustness stresses such as vibration, high temp exposure, load faults, ESD, etc.
Standard

Characterization, Conducted Immunity
2018-06-12
CURRENT
J2628_201806
The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).
Standard

Characterization, Conducted Immunity
2007-07-19
HISTORICAL
J2628_200707
The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g. Pre-Qualification, Qualification or Conformity).
Standard

Characterization, Conducted Immunity
2013-07-16
HISTORICAL
J2628_201307
The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).
Standard

Electrical Interference by Conduction and Coupling—Capacitive and Inductive Coupling via Lines Other than Supply Lines
2006-08-30
HISTORICAL
J1113/12_200608
This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented – Capacitive Coupling Clamp, Chattering Relay, Direct Capacitor Coupling, and Inductive Coupling Clamp.
Standard

Electrical Interference by Conduction and Coupling - Capacitive and Inductive Coupling via Lines Other than Supply Lines
2022-09-30
CURRENT
J1113/12_202209
This SAE Standard establishes test methods for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test methods demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductive loads, relay contact bouncing, etc. Four test methods are presented in SAE J1113-12: the capacitive coupling clamp (CCC) method the direct capacitive coupling (DCC) method the inductive coupling clamp (ICC) method the capacitive/inductive coupling (CIC) method
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields
2022-09-30
CURRENT
J551/16_202209
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
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