Standard
Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Photoelectron Spectroscopy (XPS) Test Method
2016-12-09
WIP
AS6171/20
This document defines capabilities and limitations of XPS as they pertain to Suspect/Counterfeit EEE part detection. Additionally, this document outlines requirements associated with the application of XPS, including training of instrument users, sample preparation, data interpretation, calibration, and reporting of test results. The Test Laboratory shall be accredited to ISO/IEC 17025 to perform one or more of the XPS Test Methods as defined in this standard. The Test Laboratory shall indicate in the ISO/IEC 17025 scope statement that they are accredited to XPS Spectral Analysis. In addition, the ISO/IEC 17025 scope statement shall indicate if the Test Laboratory is accredited to any of the following XPS Test Methods: XPS Imaging; XPS Depth Profiling; Angle Resolved XPS.